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Dive into the research topics of 'Investigation of the band offsets caused by thin Al 2O 3 layers in HfO 2 based Si metal oxide semiconductor devices'. Together they form a unique fingerprint.- Sort by
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Lior Kornblum*, Boris Meyler, Catherine Cytermann, Svetlana Yofis, Joseph Salzman, Moshe Eizenberg
Research output: Contribution to journal › Article › peer-review