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A Review on Dielectric Breakdown in Thin Dielectrics: Silicon Dioxide, High-k, and Layered Dielectrics
Felix Palumbo*, Chao Wen, Salvatore Lombardo, Sebastian Pazos, Fernando Aguirre, Moshe Eizenberg, Fei Hui, Mario Lanza
*Corresponding author for this work
Research output: Contribution to journal › Review article › peer-review
124
Scopus
citations