Raman scattering and stress measurements in Si1-xGex layers epitaxially grown on Si(100) by ion-beam sputter deposition

F. Meyer*, M. Zafrany, M. Eizenberg, R. Beserman, C. Schwebel, C. Pellet

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

39 Scopus citations

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Physics & Astronomy