Lifetime-limited current in Cu-gate metal-oxide-semiconductor capacitors subjected to bias thermal stress

E. Lipp*, A. Kohn, M. Eizenberg

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Fingerprint Dive into the research topics of 'Lifetime-limited current in Cu-gate metal-oxide-semiconductor capacitors subjected to bias thermal stress'. Together they form a unique fingerprint.

Physics & Astronomy