18O distributions in porous anodic alumina by plasma profiling time-of-flight mass spectrometry and nuclear reaction analysis

A. Baron Wiecheć; A. Tempez; P. Skeldon; P. Chapon; G. E. Thompson

doi:10.1002/sia.5032

¹⁸O distributions in porous anodic alumina by plasma profiling time-of-flight mass spectrometry and nuclear reaction analysis

A. Baron Wiecheć^*, A. Tempez, P. Skeldon, P. Chapon, G. E. Thompson

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

A comparison is made between plasma profiling time-of-flight mass spectrometry (PP-TOFMS) and nuclear reaction analysis (NRA) for depth profiling of ¹⁸O tracer in porous anodic oxide films on aluminum. The films were formed galvanostatically, for a range of times, using phosphoric acid electrolytes that were either enriched in ¹⁸O or of the natural isotopic concentration. The morphologies of the films were determined by electron microscopy. The findings from PP-TOFMS and NRA reveal a partitioning of the tracer between the surface regions and buried layers of the films. However, a relatively high background of ¹⁶O in PP-TOFMS prevents a reliable quantification of the concentration of ¹⁸O.

Original language	English
Pages (from-to)	1346-1352
Number of pages	7
Journal	Surface and Interface Analysis
Volume	44
Issue number	10
DOIs	https://doi.org/10.1002/sia.5032
State	Published - Oct 2012
Externally published	Yes

Keywords

NRA
PP-TOFMS
aluminum
anodizing

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title = "18O distributions in porous anodic alumina by plasma profiling time-of-flight mass spectrometry and nuclear reaction analysis",

abstract = "A comparison is made between plasma profiling time-of-flight mass spectrometry (PP-TOFMS) and nuclear reaction analysis (NRA) for depth profiling of 18O tracer in porous anodic oxide films on aluminum. The films were formed galvanostatically, for a range of times, using phosphoric acid electrolytes that were either enriched in 18O or of the natural isotopic concentration. The morphologies of the films were determined by electron microscopy. The findings from PP-TOFMS and NRA reveal a partitioning of the tracer between the surface regions and buried layers of the films. However, a relatively high background of 16O in PP-TOFMS prevents a reliable quantification of the concentration of 18O.",

keywords = "NRA, PP-TOFMS, aluminum, anodizing",

author = "{Baron Wieche{\'c}}, A. and A. Tempez and P. Skeldon and P. Chapon and Thompson, {G. E.}",

year = "2012",

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journal = "Surface and Interface Analysis",

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T1 - 18O distributions in porous anodic alumina by plasma profiling time-of-flight mass spectrometry and nuclear reaction analysis

AU - Baron Wiecheć, A.

AU - Tempez, A.

AU - Skeldon, P.

AU - Chapon, P.

AU - Thompson, G. E.

PY - 2012/10

Y1 - 2012/10

N2 - A comparison is made between plasma profiling time-of-flight mass spectrometry (PP-TOFMS) and nuclear reaction analysis (NRA) for depth profiling of 18O tracer in porous anodic oxide films on aluminum. The films were formed galvanostatically, for a range of times, using phosphoric acid electrolytes that were either enriched in 18O or of the natural isotopic concentration. The morphologies of the films were determined by electron microscopy. The findings from PP-TOFMS and NRA reveal a partitioning of the tracer between the surface regions and buried layers of the films. However, a relatively high background of 16O in PP-TOFMS prevents a reliable quantification of the concentration of 18O.

AB - A comparison is made between plasma profiling time-of-flight mass spectrometry (PP-TOFMS) and nuclear reaction analysis (NRA) for depth profiling of 18O tracer in porous anodic oxide films on aluminum. The films were formed galvanostatically, for a range of times, using phosphoric acid electrolytes that were either enriched in 18O or of the natural isotopic concentration. The morphologies of the films were determined by electron microscopy. The findings from PP-TOFMS and NRA reveal a partitioning of the tracer between the surface regions and buried layers of the films. However, a relatively high background of 16O in PP-TOFMS prevents a reliable quantification of the concentration of 18O.

KW - NRA

KW - PP-TOFMS

KW - aluminum

KW - anodizing

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U2 - 10.1002/sia.5032

DO - 10.1002/sia.5032

M3 - 文章

AN - SCOPUS:85027928404

SN - 0142-2421

VL - 44

SP - 1346

EP - 1352

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

IS - 10

ER -

¹⁸O distributions in porous anodic alumina by plasma profiling time-of-flight mass spectrometry and nuclear reaction analysis

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Keywords

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