Texture determination of thin Cu-wires by synchrotron radiation

H. G. Brokmeier*, B. Weiss, S. B. Yi, Wenhai Ye Yi, K. D. Liss, T. Lippmann

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations


A new method to investigate thin wires has been tested, which is based on a special sample holder and on a high energy X-rays. Due to the high penetration power of high energy X-rays quantitative texture data will be obtained without any additional corrections such as constant volume correction and absorption correction. The measurements have been carried out at the high energy beam line BW5 at HASYLAB - DESY (Hamburg). In order to overcome grain statistics problems on the investigated Cu-wire of 122μm thickness a special scanning routine together with the sample preparation allows to average over a wire length between 1mm and up to 240 mm.

Original languageEnglish
Title of host publicationTextures of Materials, ICOTOM 14 - Proceedings of the 14th International Conference on Textures of Materials
PublisherTrans Tech Publications Ltd
Number of pages6
EditionPART 1
ISBN (Print)087849975X, 9780878499755
StatePublished - 2005
Externally publishedYes
Event14th International Conference on Textures of Materials, ICOTOM 14 - Leuven, Belgium
Duration: 11 Jul 200515 Jul 2005

Publication series

NameMaterials Science Forum
NumberPART 1
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752


Conference14th International Conference on Textures of Materials, ICOTOM 14


  • Copper
  • Synchrotron radiation
  • Texture
  • Thin wire


Dive into the research topics of 'Texture determination of thin Cu-wires by synchrotron radiation'. Together they form a unique fingerprint.

Cite this