Temperature dependence of trapping effects in metal gates/Al2O3/InGaAs stacks

F. Palumbo*, S. Pazos, F. Aguirre, R. Winter, I. Krylov, M. Eizenberg

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Fingerprint

Dive into the research topics of 'Temperature dependence of trapping effects in metal gates/Al2O3/InGaAs stacks'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science

Chemical Compounds