Structural characterization of epitaxial Fe/Cr multilayers using anomalous X-ray and neutron reflectivity

A. Gupta; A. Paul; M. Gupta; C. Meneghini; U. Pietsch; K. Mibu; A. Maddalena; S. Dal Toé; G. Principi

doi:10.1016/j.jmmm.2003.12.058

Structural characterization of epitaxial Fe/Cr multilayers using anomalous X-ray and neutron reflectivity

A. Gupta, A. Paul, M. Gupta, C. Meneghini, U. Pietsch, K. Mibu, A. Maddalena, S. Dal Toé, G. Principi^*

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

7 Scopus citations

Abstract

The interface structure of epitaxial Fe/Cr multilayers was studied using anomalous X-ray and neutron reflectivity. The analysis of X-ray reflectivity at three different energies provided a reliable information about the interface roughnesses. It is found that the Cr-on-Fe interface is more diffused as compared to the Fe-on-Cr interface and that the roughness exhibits a significant increase with increasing depth. The magnetic roughness, as determined from neutron reflectivity, is lower than the geometrical roughness, in conformity with the behavior of a number of magnetic thin films and multilayers.

Original language	English
Pages (from-to)	1219-1220
Number of pages	2
Journal	Journal of Magnetism and Magnetic Materials
Volume	272-276
DOIs	https://doi.org/10.1016/j.jmmm.2003.12.058
State	Published - May 2004
Externally published	Yes
Event	Proceedings of the International Conference on Magnetism - Rome, Italy Duration: 27 Jul 2003 → 1 Aug 2003

Keywords

GMR
Interface roughness
Magnetic multilayer
Magnetic roughness
Reflectivity

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10.1016/j.jmmm.2003.12.058

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title = "Structural characterization of epitaxial Fe/Cr multilayers using anomalous X-ray and neutron reflectivity",

abstract = "The interface structure of epitaxial Fe/Cr multilayers was studied using anomalous X-ray and neutron reflectivity. The analysis of X-ray reflectivity at three different energies provided a reliable information about the interface roughnesses. It is found that the Cr-on-Fe interface is more diffused as compared to the Fe-on-Cr interface and that the roughness exhibits a significant increase with increasing depth. The magnetic roughness, as determined from neutron reflectivity, is lower than the geometrical roughness, in conformity with the behavior of a number of magnetic thin films and multilayers.",

keywords = "GMR, Interface roughness, Magnetic multilayer, Magnetic roughness, Reflectivity",

author = "A. Gupta and A. Paul and M. Gupta and C. Meneghini and U. Pietsch and K. Mibu and A. Maddalena and {Dal To{\'e}}, S. and G. Principi",

year = "2004",

month = may,

doi = "10.1016/j.jmmm.2003.12.058",

language = "英语",

volume = "272-276",

pages = "1219--1220",

journal = "Journal of Magnetism and Magnetic Materials",

issn = "0304-8853",

publisher = "Elsevier",

note = "null ; Conference date: 27-07-2003 Through 01-08-2003",

}

TY - JOUR

T1 - Structural characterization of epitaxial Fe/Cr multilayers using anomalous X-ray and neutron reflectivity

AU - Gupta, A.

AU - Paul, A.

AU - Gupta, M.

AU - Meneghini, C.

AU - Pietsch, U.

AU - Mibu, K.

AU - Maddalena, A.

AU - Dal Toé, S.

AU - Principi, G.

PY - 2004/5

Y1 - 2004/5

N2 - The interface structure of epitaxial Fe/Cr multilayers was studied using anomalous X-ray and neutron reflectivity. The analysis of X-ray reflectivity at three different energies provided a reliable information about the interface roughnesses. It is found that the Cr-on-Fe interface is more diffused as compared to the Fe-on-Cr interface and that the roughness exhibits a significant increase with increasing depth. The magnetic roughness, as determined from neutron reflectivity, is lower than the geometrical roughness, in conformity with the behavior of a number of magnetic thin films and multilayers.

AB - The interface structure of epitaxial Fe/Cr multilayers was studied using anomalous X-ray and neutron reflectivity. The analysis of X-ray reflectivity at three different energies provided a reliable information about the interface roughnesses. It is found that the Cr-on-Fe interface is more diffused as compared to the Fe-on-Cr interface and that the roughness exhibits a significant increase with increasing depth. The magnetic roughness, as determined from neutron reflectivity, is lower than the geometrical roughness, in conformity with the behavior of a number of magnetic thin films and multilayers.

KW - GMR

KW - Interface roughness

KW - Magnetic multilayer

KW - Magnetic roughness

KW - Reflectivity

UR - http://www.scopus.com/inward/record.url?scp=2642584209&partnerID=8YFLogxK

U2 - 10.1016/j.jmmm.2003.12.058

DO - 10.1016/j.jmmm.2003.12.058

M3 - 会议文章

AN - SCOPUS:2642584209

SN - 0304-8853

VL - 272-276

SP - 1219

EP - 1220

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

Y2 - 27 July 2003 through 1 August 2003

ER -

Structural characterization of epitaxial Fe/Cr multilayers using anomalous X-ray and neutron reflectivity

Abstract

Keywords

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