Sparsity-based Ankylography: Recovering 3D structures from a single-shot 2D scattered intensity

Maor Mutzafi, Yoav Shechtman, Oren Cohen, Yonina C. Eldar C., Mordechai Segev*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present an algorithmic paradigm for deciphering the 3D structure of a molecule from the far-field intensity of scattered x-ray photons before the molecule disintegrates. Our approach enables surpassing current limits on recoverable information capacity.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationQELS_Fundamental Science, CLEO_QELS 2014
PublisherOptical Society of America (OSA)
ISBN (Print)9781557529992, 9781557529992
DOIs
StatePublished - 2014
Externally publishedYes
EventCLEO: QELS_Fundamental Science, CLEO_QELS 2014 - San Jose, CA, United States
Duration: 8 Jun 201413 Jun 2014

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceCLEO: QELS_Fundamental Science, CLEO_QELS 2014
Country/TerritoryUnited States
CitySan Jose, CA
Period8/06/1413/06/14

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