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Raman scattering and stress measurements in Si1-xGex layers epitaxially grown on Si(100) by ion-beam sputter deposition
F. Meyer*, M. Zafrany, M. Eizenberg, R. Beserman, C. Schwebel, C. Pellet
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
40
Scopus
citations