Photodegradation of organic light-emitting devices observed in nitrogen-filled environment

TY - JOUR

T1 - Photodegradation of organic light-emitting devices observed in nitrogen-filled environment

AU - Wang, X. Z.

AU - Gao, X. D.

AU - Zhou, Y. C.

AU - Xie, Z. T.

AU - Song, Q. L.

AU - Ding, X. M.

AU - Hou, X. Y.

N1 - Funding Information: This work is supported by the Chinese National Key Basic Research Special Fund and the National Natural Science Foundation of China.

PY - 2008/2/29

Y1 - 2008/2/29

N2 - Degradation of organic light-emitting devices (OLEDs) upon ultraviolet (UV) irradiation has been studied by measuring luminance-voltage (L-V) and current-voltage (I-V) characteristics of the devices in a nitrogen-filled glove-box. Photo-oxidation or reaction is no longer the main origin of the degradation for the devices protected by nitrogen. Conventional double-layer OLEDs with tris(8-hydroxyquinoline) aluminum (Alq3) as the electron transport material and single-layer devices containing Alq3 as the only organic material exhibit different degradation behaviors: both L-V and I-V characteristics degrade severely for the irradiated double-layer devices, whereas whether I-V degrades or not in a single-layer device is closely related to the species of the charge carriers flowing in the device. By comparing electroluminescent and photoluminescent degradation behaviors of the single-Alq3-layer devices, we conclude that lowered fluorescent quantum efficiency and hole current after UV irradiation are two origins of the degraded characteristics of the devices isolated from the moist environment.

AB - Degradation of organic light-emitting devices (OLEDs) upon ultraviolet (UV) irradiation has been studied by measuring luminance-voltage (L-V) and current-voltage (I-V) characteristics of the devices in a nitrogen-filled glove-box. Photo-oxidation or reaction is no longer the main origin of the degradation for the devices protected by nitrogen. Conventional double-layer OLEDs with tris(8-hydroxyquinoline) aluminum (Alq3) as the electron transport material and single-layer devices containing Alq3 as the only organic material exhibit different degradation behaviors: both L-V and I-V characteristics degrade severely for the irradiated double-layer devices, whereas whether I-V degrades or not in a single-layer device is closely related to the species of the charge carriers flowing in the device. By comparing electroluminescent and photoluminescent degradation behaviors of the single-Alq3-layer devices, we conclude that lowered fluorescent quantum efficiency and hole current after UV irradiation are two origins of the degraded characteristics of the devices isolated from the moist environment.

KW - Electrical properties and measurements

KW - Electronic devices

KW - Organic semiconductors

KW - Photoluminescence

UR - http://www.scopus.com/inward/record.url?scp=38649110762&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2007.06.141

DO - 10.1016/j.tsf.2007.06.141

M3 - 文章

AN - SCOPUS:38649110762

SN - 0040-6090

VL - 516

SP - 2171

EP - 2174

JO - Thin Solid Films

JF - Thin Solid Films

IS - 8

ER -