TY - JOUR
T1 - Optical contrast and refractive index of natural van der Waals heterostructure nanosheets of franckeite
AU - Gant, Patricia
AU - Ghasemi, Foad
AU - Maeso, David
AU - Munuera, Carmen
AU - López-Elvira, Elena
AU - Frisenda, Riccardo
AU - De Lara, David Pérez
AU - Rubio-Bollinger, Gabino
AU - Garcia-Hernandez, Mar
AU - Castellanos-Gomez, Andres
N1 - Publisher Copyright:
© 2017 Gant et al.
PY - 2017
Y1 - 2017
N2 - We study mechanically exfoliated nanosheets of franckeite by quantitative optical microscopy. The analysis of transmission-mode and epi-illumination-mode optical microscopy images provides a rapid method to estimate the thickness of the exfoliated flakes at first glance. A quantitative analysis of the optical contrast spectra by means of micro-reflectance allows one to determine the refractive index of franckeite over a broad range of the visible spectrum through a fit of the acquired spectra to a model based on the Fresnel law.
AB - We study mechanically exfoliated nanosheets of franckeite by quantitative optical microscopy. The analysis of transmission-mode and epi-illumination-mode optical microscopy images provides a rapid method to estimate the thickness of the exfoliated flakes at first glance. A quantitative analysis of the optical contrast spectra by means of micro-reflectance allows one to determine the refractive index of franckeite over a broad range of the visible spectrum through a fit of the acquired spectra to a model based on the Fresnel law.
KW - Complex refractive index
KW - Franckeite
KW - Optical contrast
KW - Optical identification
KW - Van der Waals heterostructure
UR - http://www.scopus.com/inward/record.url?scp=85034261670&partnerID=8YFLogxK
U2 - 10.3762/bjnano.8.235
DO - 10.3762/bjnano.8.235
M3 - 文章
AN - SCOPUS:85034261670
VL - 8
SP - 2357
EP - 2362
JO - Beilstein Journal of Nanotechnology
JF - Beilstein Journal of Nanotechnology
SN - 2190-4286
IS - 1
ER -