Lithography-free electrical transport measurements on 2D materials by direct microprobing

Patricia Gant, Yue Niu, Simon A. Svatek, Nicolás Agraït, Carmen Munuera, Mar García-Hernández, Riccardo Frisenda, David Perez De Lara, Andres Castellanos-Gomez*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations


We present a method to carry out electrical and optoelectronic measurements on 2D materials using carbon fiber microprobes to directly make electrical contacts with the 2D materials without damaging them. The working principle of this microprobing method is illustrated by measuring transport in MoS2 flakes in vertical (transport in the out-of-plane direction) and lateral (transport within the crystal plane) configurations, finding performances comparable to those reported for MoS2 devices fabricated by the conventional lithographic process. We also show that this method can be used with other 2D materials.

Original languageEnglish
Pages (from-to)11252-11258
Number of pages7
JournalJournal of Materials Chemistry C
Issue number43
StatePublished - 2017
Externally publishedYes


Dive into the research topics of 'Lithography-free electrical transport measurements on 2D materials by direct microprobing'. Together they form a unique fingerprint.

Cite this