Investigation of electromigration in copper interconnects by noise measurements

Vitali Emelianov*, Gopal Ganesan, Aleksandar Puzic, Stefan Schulz, Moshe Eizenberg, Hanns Ulrich Habermeier, Hermann Stoll

*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

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