Fourier transform spectral imaging microscopy (FT-SIM) and scanning Raman microscopy for the detection of indoor common contaminants on the surface of dental implants

Anna Lutin, Valery Bulatov, Yusuf Jadwat, Neil H. Wood, Liviu Feller, Israel Schechter*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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Chemical Compounds