Fourier transform spectral imaging microscopy (FT-SIM) and scanning Raman microscopy for the detection of indoor common contaminants on the surface of dental implants

TY - JOUR

T1 - Fourier transform spectral imaging microscopy (FT-SIM) and scanning Raman microscopy for the detection of indoor common contaminants on the surface of dental implants

AU - Lutin, Anna

AU - Bulatov, Valery

AU - Jadwat, Yusuf

AU - Wood, Neil H.

AU - Feller, Liviu

AU - Schechter, Israel

N1 - Publisher Copyright: © 2014 Elsevier B.V. All rights reserved.

PY - 2015/3/1

Y1 - 2015/3/1

N2 - Endosteal dental implants are used routinely with high success rates to rehabilitate the integrity of the dentition. However if implant surfaces become contaminated by foreign material, osseointegration may not occur and the dental implant will fail because of the lack of mechanical stability. Detection and characterization of dental implant surface contaminants is a difficult task. In this article we investigate the application of several spectral microscopy methods to detect airborne contaminants on dental implant surfaces. We found that Fourier Transform Spectral Imaging Microscopy (FT-SIM) and scanning Raman microscopy provided the most useful information. Some implants possess weak and homogeneous auto-fluorescence and are best analyzed using FT-SIM methods, while others are Raman inactive and can be analyzed using scanning Raman microscopy.

AB - Endosteal dental implants are used routinely with high success rates to rehabilitate the integrity of the dentition. However if implant surfaces become contaminated by foreign material, osseointegration may not occur and the dental implant will fail because of the lack of mechanical stability. Detection and characterization of dental implant surface contaminants is a difficult task. In this article we investigate the application of several spectral microscopy methods to detect airborne contaminants on dental implant surfaces. We found that Fourier Transform Spectral Imaging Microscopy (FT-SIM) and scanning Raman microscopy provided the most useful information. Some implants possess weak and homogeneous auto-fluorescence and are best analyzed using FT-SIM methods, while others are Raman inactive and can be analyzed using scanning Raman microscopy.

KW - Analysis

KW - Contamination

KW - Dental

KW - Inplant

KW - Spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=84919498630&partnerID=8YFLogxK

U2 - 10.1016/j.talanta.2014.11.060

DO - 10.1016/j.talanta.2014.11.060

M3 - 文章

C2 - 25618702

AN - SCOPUS:84919498630

SN - 0039-9140

VL - 134

SP - 514

EP - 523

JO - Talanta

JF - Talanta

ER -