Abstract
The formation of TiSi2 was compared over samples implanted with arsenic and BF2 at different doses and annealed at different temperatures and lengths of time in a rapid thermal process. Measurements were done to determine the composition and thickness of the silicide formed. The composition was determined from Auger electron spectroscopy, Rutherford backscattering spectroscopy, and transmission electron microscopy. The phase formation of the silicide was characterized by X-ray diffraction. Dopant redistribution was studied using secondary ion mass spectroscopy. Comparing the results of the different implant doses we found that the amount of silicide formed over heavily doped Si at formation temperatures of 600 °C to 650 °C was reduced compared to undoped Si. At formation temperatures above 750 °C the implanted dose and species did not significantly affect the amount of silicide formation. Above 750 °C the TiSi2 structure was found to be the C54 phase. Arsenic was found to diffuse into the Ti silicide layer in a diffusion controlled process. Boron was found to accumulate at the Ti silicide interfaces both with the substrate and with the surface TixOyNz layer.
| Original language | English |
|---|---|
| Pages (from-to) | 253-258 |
| Number of pages | 6 |
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 470 |
| DOIs | |
| State | Published - 1997 |
| Externally published | Yes |
| Event | Proceedings of the 1997 MRS Spring Meeting - San Francisco, CA, USA Duration: 1 Apr 1997 → 4 Apr 1997 |