Enhanced exchange bias in ferromagnet/antiferromagnet multilayers

Amitesh Paul; Daniel E. Bürgler; Peter Grünberg

doi:10.1016/j.jmmm.2004.09.054

Enhanced exchange bias in ferromagnet/antiferromagnet multilayers

Amitesh Paul, Daniel E. Bürgler, Peter Grünberg

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

We study a series of NiFe(10.0nm)/[Ir20Mn80(6.0nm)/Co80Fe20(3.0nm)]N multilayers with different numbers N of bilayers grown by DC magnetron sputtering. After field-cooling, SQUID and MOKE measurements show a sizable increase of the exchange bias field with N. X-ray specular and diffuse scattering data reveal no significant variation of the lateral correlation length and only a weak dependence of the vertical rms interface roughness on N. Atomic and magnetic force microscopy, however, show a strong reduction of the grain size accompanied by distinct changes of the magnetic domain structure. We conclude that the enhancement of the exchange bias effect is related to the shrinking of the domain size in the antiferromagnet due to the structural evolution in the multilayers.

Original language	English
Pages (from-to)	216-219
Number of pages	4
Journal	Journal of Magnetism and Magnetic Materials
Volume	286
Issue number	SPEC. ISS.
DOIs	https://doi.org/10.1016/j.jmmm.2004.09.054
State	Published - Feb 2005
Externally published	Yes

Keywords

Exchange bias
Microstructure
Multilayer

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10.1016/j.jmmm.2004.09.054

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title = "Enhanced exchange bias in ferromagnet/antiferromagnet multilayers",

abstract = "We study a series of NiFe(10.0nm)/[Ir20Mn80(6.0nm)/Co80Fe20(3.0nm)]N multilayers with different numbers N of bilayers grown by DC magnetron sputtering. After field-cooling, SQUID and MOKE measurements show a sizable increase of the exchange bias field with N. X-ray specular and diffuse scattering data reveal no significant variation of the lateral correlation length and only a weak dependence of the vertical rms interface roughness on N. Atomic and magnetic force microscopy, however, show a strong reduction of the grain size accompanied by distinct changes of the magnetic domain structure. We conclude that the enhancement of the exchange bias effect is related to the shrinking of the domain size in the antiferromagnet due to the structural evolution in the multilayers.",

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author = "Amitesh Paul and B{\"u}rgler, {Daniel E.} and Peter Gr{\"u}nberg",

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T1 - Enhanced exchange bias in ferromagnet/antiferromagnet multilayers

AU - Paul, Amitesh

AU - Bürgler, Daniel E.

AU - Grünberg, Peter

PY - 2005/2

Y1 - 2005/2

N2 - We study a series of NiFe(10.0nm)/[Ir20Mn80(6.0nm)/Co80Fe20(3.0nm)]N multilayers with different numbers N of bilayers grown by DC magnetron sputtering. After field-cooling, SQUID and MOKE measurements show a sizable increase of the exchange bias field with N. X-ray specular and diffuse scattering data reveal no significant variation of the lateral correlation length and only a weak dependence of the vertical rms interface roughness on N. Atomic and magnetic force microscopy, however, show a strong reduction of the grain size accompanied by distinct changes of the magnetic domain structure. We conclude that the enhancement of the exchange bias effect is related to the shrinking of the domain size in the antiferromagnet due to the structural evolution in the multilayers.

AB - We study a series of NiFe(10.0nm)/[Ir20Mn80(6.0nm)/Co80Fe20(3.0nm)]N multilayers with different numbers N of bilayers grown by DC magnetron sputtering. After field-cooling, SQUID and MOKE measurements show a sizable increase of the exchange bias field with N. X-ray specular and diffuse scattering data reveal no significant variation of the lateral correlation length and only a weak dependence of the vertical rms interface roughness on N. Atomic and magnetic force microscopy, however, show a strong reduction of the grain size accompanied by distinct changes of the magnetic domain structure. We conclude that the enhancement of the exchange bias effect is related to the shrinking of the domain size in the antiferromagnet due to the structural evolution in the multilayers.

KW - Exchange bias

KW - Microstructure

KW - Multilayer

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DO - 10.1016/j.jmmm.2004.09.054

M3 - 文章

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JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

SN - 0304-8853

IS - SPEC. ISS.

ER -

Enhanced exchange bias in ferromagnet/antiferromagnet multilayers

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Keywords

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