Abstract
Residual stress analysis was analyzed using high-energy synchrotron diffraction. Texture and stress analyses were also carried out using the energy dispersive methods, and parameters such as penetration depth, peak brightness were also determined. Coarse grain materials were analyzed and large spectral ranges along with high energy values were obtained.
Original language | English |
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Pages (from-to) | 34-39 |
Number of pages | 6 |
Journal | Materials Science Forum |
Volume | 347 |
State | Published - 2000 |
Externally published | Yes |
Event | Proceedings of the 5th European Conference on Residual Stresses - Delft-Noordwijkerhout, Neth Duration: 28 Sep 1999 → 30 Sep 1999 |