Fingerprint
Dive into the research topics of 'Characteristics of stress-induced defects under positive bias in high-k/InGaAs stacks'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Characteristics of stress-induced defects under positive bias in high-k/InGaAs stacks
F. Palumbo*, R. Winter, I. Krylov, M. Eizenberg
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
5
Scopus
citations