Abstract
Despite its promise for science and application, the electrostatic origins of the surface potential modulation caused by self-assembled monolayers (SAMs) are still not fully clear. Recently the beveled oxide method has been demonstrated as a means of measuring the electrostatic effects induced by SAM, based on a series of metal-oxide-semiconductor capacitors. In this work the beveled oxide method is expanded and applied on a series of four different alkyltrichlorosilanes monolayers. It is found that hexyltrichlorosilanes produce the largest modulation among the measured molecules. The application and limitations of the method are further discussed.
Original language | English |
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Pages (from-to) | 233-237 |
Number of pages | 5 |
Journal | Journal of Physical Chemistry C |
Volume | 117 |
Issue number | 1 |
DOIs | |
State | Published - 10 Jan 2013 |
Externally published | Yes |