Wavelength resolution options for a time-of-flight reflectometer using VITESS code of simulation

Amitesh Paul

doi:10.1016/j.nima.2011.01.028

Wavelength resolution options for a time-of-flight reflectometer using VITESS code of simulation

Amitesh Paul^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

I report on the wavelength resolution options that can be made available on a time-of-flight reflectometer. I take the example of the newly commissioned reflectometer BioRef at Helmholtz-Zentrum Berlin for the purpose. Calculations and simulations using the software package VITESS, I show potential increase in flux densities, an extension of the momentum transfer range accessible as well as a significant extension of the range of constant wavelength resolution of the instrument. It is therefore possible to achieve a virtually continuous range of wavelength resolution from 5% to 11% by using a combination of four different chopper systems. This can be a unique advantage on the time-of-flight reflectometer in investigating thin-film structures accessing a wide range of thicknesses.

Original language	English
Pages (from-to)	158-166
Number of pages	9
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	646
Issue number	1
DOIs	https://doi.org/10.1016/j.nima.2011.01.028
State	Published - 1 Aug 2011
Externally published	Yes

Access to Document

10.1016/j.nima.2011.01.028

Cite this

@article{0df57452eb9d4d5697116244854325b8,

title = "Wavelength resolution options for a time-of-flight reflectometer using VITESS code of simulation",

abstract = "I report on the wavelength resolution options that can be made available on a time-of-flight reflectometer. I take the example of the newly commissioned reflectometer BioRef at Helmholtz-Zentrum Berlin for the purpose. Calculations and simulations using the software package VITESS, I show potential increase in flux densities, an extension of the momentum transfer range accessible as well as a significant extension of the range of constant wavelength resolution of the instrument. It is therefore possible to achieve a virtually continuous range of wavelength resolution from 5% to 11% by using a combination of four different chopper systems. This can be a unique advantage on the time-of-flight reflectometer in investigating thin-film structures accessing a wide range of thicknesses.",

author = "Amitesh Paul",

year = "2011",

month = aug,

day = "1",

doi = "10.1016/j.nima.2011.01.028",

language = "英语",

volume = "646",

pages = "158--166",

journal = "Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",

issn = "0168-9002",

publisher = "Elsevier",

number = "1",

}

TY - JOUR

T1 - Wavelength resolution options for a time-of-flight reflectometer using VITESS code of simulation

AU - Paul, Amitesh

PY - 2011/8/1

Y1 - 2011/8/1

N2 - I report on the wavelength resolution options that can be made available on a time-of-flight reflectometer. I take the example of the newly commissioned reflectometer BioRef at Helmholtz-Zentrum Berlin for the purpose. Calculations and simulations using the software package VITESS, I show potential increase in flux densities, an extension of the momentum transfer range accessible as well as a significant extension of the range of constant wavelength resolution of the instrument. It is therefore possible to achieve a virtually continuous range of wavelength resolution from 5% to 11% by using a combination of four different chopper systems. This can be a unique advantage on the time-of-flight reflectometer in investigating thin-film structures accessing a wide range of thicknesses.

AB - I report on the wavelength resolution options that can be made available on a time-of-flight reflectometer. I take the example of the newly commissioned reflectometer BioRef at Helmholtz-Zentrum Berlin for the purpose. Calculations and simulations using the software package VITESS, I show potential increase in flux densities, an extension of the momentum transfer range accessible as well as a significant extension of the range of constant wavelength resolution of the instrument. It is therefore possible to achieve a virtually continuous range of wavelength resolution from 5% to 11% by using a combination of four different chopper systems. This can be a unique advantage on the time-of-flight reflectometer in investigating thin-film structures accessing a wide range of thicknesses.

UR - http://www.scopus.com/inward/record.url?scp=79958239269&partnerID=8YFLogxK

U2 - 10.1016/j.nima.2011.01.028

DO - 10.1016/j.nima.2011.01.028

M3 - 文章

AN - SCOPUS:79958239269

VL - 646

SP - 158

EP - 166

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

SN - 0168-9002

IS - 1

ER -

Wavelength resolution options for a time-of-flight reflectometer using VITESS code of simulation

Abstract

Access to Document

Other files and links

Fingerprint

Cite this