Use of high-energy synchrotron diffraction for residual stress analyses

W. Reimers*, A. Pyzalla, M. Broda, G. Brusch, D. Dantz, T. Schmackers, K. D. Liss, T. Tschentscher

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

36 Scopus citations

Abstract

The application of high-energy synchrotron diffraction (HESD) for residual stress analysis was studied at the high-energy beam line ID15A in Grenoble, France. The measurements were performed using an 80 μm slit in the incoming beam and two 100 μm slits in the reflected beam. The main advantages of HESD are illustrated in three examples, namely: a ceramic matrix composites (CMC); a thermal barrier coating (TBC); and a cold-forward-extruded steel sample. From the examples of HESD residual stress analysis on a CMC, a TBC, and a textured sample demonstrated that the method has strong advantages with respect to the high penetration depth and the high local resolution achievable, as well as to the simultaneous investigation of residual stresses and texture.

Original languageEnglish
Pages (from-to)581-583
Number of pages3
JournalJournal of Materials Science Letters
Volume18
Issue number7
DOIs
StatePublished - 1999
Externally publishedYes

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