TY - JOUR
T1 - Thickness-dependent differential reflectance spectra of monolayer and few-layer MoS2, MoSe2, WS2 and WSe2
AU - Niu, Yue
AU - Gonzalez-Abad, Sergio
AU - Frisenda, Riccardo
AU - Marauhn, Philipp
AU - Drüppel, Matthias
AU - Gant, Patricia
AU - Schmidt, Robert
AU - Taghavi, Najme S.
AU - Barcons, David
AU - Molina-Mendoza, Aday J.
AU - de Vasconcellos, Steffen Michaelis
AU - Bratschitsch, Rudolf
AU - De Lara, David Perez
AU - Rohlfing, Michael
AU - Castellanos-Gomez, Andres
N1 - Publisher Copyright:
© 2018 by the authors. Licensee MDPI, Basel, Switzerland.
Copyright:
Copyright 2018 Elsevier B.V., All rights reserved.
PY - 2018/9/14
Y1 - 2018/9/14
N2 - The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nanomaterials. We presented a comprehensive study of the differential reflectance spectra of 2D semiconducting transition metal dichalcogenides (TMDCs), MoS2, MoSe2, WS2, and WSe2, with thickness ranging from one layer up to six layers. We analyzed the thickness-dependent energy of the different excitonic features, indicating the change in the band structure of the different TMDC materials with the number of layers. Our work provided a route to employ differential reflectance spectroscopy for determining the number of layers of MoS2, MoSe2, WS2, and WSe2.
AB - The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nanomaterials. We presented a comprehensive study of the differential reflectance spectra of 2D semiconducting transition metal dichalcogenides (TMDCs), MoS2, MoSe2, WS2, and WSe2, with thickness ranging from one layer up to six layers. We analyzed the thickness-dependent energy of the different excitonic features, indicating the change in the band structure of the different TMDC materials with the number of layers. Our work provided a route to employ differential reflectance spectroscopy for determining the number of layers of MoS2, MoSe2, WS2, and WSe2.
KW - 2D materials
KW - Differential reflectance
KW - MoS
KW - MoSe
KW - Optical properties
KW - Transition metal dichalcogenides (TMDCs)
KW - WS
KW - WSe
UR - http://www.scopus.com/inward/record.url?scp=85054267953&partnerID=8YFLogxK
U2 - 10.3390/nano8090725
DO - 10.3390/nano8090725
M3 - 文章
AN - SCOPUS:85054267953
VL - 8
JO - Nanomaterials
JF - Nanomaterials
SN - 2079-4991
IS - 9
M1 - 725
ER -