Thickness-dependent differential reflectance spectra of monolayer and few-layer MoS2, MoSe2, WS2 and WSe2

Yue Niu; Sergio Gonzalez-Abad; Riccardo Frisenda; Philipp Marauhn; Matthias Drüppel; Patricia Gant; Robert Schmidt; Najme S. Taghavi; David Barcons; Aday J. Molina-Mendoza; Steffen Michaelis de Vasconcellos; Rudolf Bratschitsch; David Perez De Lara; Michael Rohlfing; Andres Castellanos-Gomez

doi:10.3390/nano8090725

Thickness-dependent differential reflectance spectra of monolayer and few-layer MoS₂, MoSe₂, WS₂ and WSe₂

Yue Niu, Sergio Gonzalez-Abad, Riccardo Frisenda, Philipp Marauhn, Matthias Drüppel, Patricia Gant, Robert Schmidt, Najme S. Taghavi, David Barcons, Aday J. Molina-Mendoza, Steffen Michaelis de Vasconcellos, Rudolf Bratschitsch, David Perez De Lara, Michael Rohlfing, Andres Castellanos-Gomez^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

53 Scopus citations

Abstract

The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nanomaterials. We presented a comprehensive study of the differential reflectance spectra of 2D semiconducting transition metal dichalcogenides (TMDCs), MoS₂, MoSe₂, WS₂, and WSe₂, with thickness ranging from one layer up to six layers. We analyzed the thickness-dependent energy of the different excitonic features, indicating the change in the band structure of the different TMDC materials with the number of layers. Our work provided a route to employ differential reflectance spectroscopy for determining the number of layers of MoS₂, MoSe₂, WS₂, and WSe₂.

Original language	English
Article number	725
Journal	Nanomaterials
Volume	8
Issue number	9
DOIs	https://doi.org/10.3390/nano8090725
State	Published - 14 Sep 2018
Externally published	Yes

Keywords

2D materials
Differential reflectance
MoS
MoSe
Optical properties
Transition metal dichalcogenides (TMDCs)
WS
WSe

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Niu, Y., Gonzalez-Abad, S., Frisenda, R., Marauhn, P., Drüppel, M., Gant, P., Schmidt, R., Taghavi, N. S., Barcons, D., Molina-Mendoza, A. J., de Vasconcellos, S. M., Bratschitsch, R., De Lara, D. P., Rohlfing, M., & Castellanos-Gomez, A. (2018). Thickness-dependent differential reflectance spectra of monolayer and few-layer MoS₂, MoSe₂, WS₂ and WSe₂ Nanomaterials, 8(9), [725]. https://doi.org/10.3390/nano8090725

Niu, Yue ; Gonzalez-Abad, Sergio ; Frisenda, Riccardo ; Marauhn, Philipp ; Drüppel, Matthias ; Gant, Patricia ; Schmidt, Robert ; Taghavi, Najme S. ; Barcons, David ; Molina-Mendoza, Aday J. ; de Vasconcellos, Steffen Michaelis ; Bratschitsch, Rudolf ; De Lara, David Perez ; Rohlfing, Michael ; Castellanos-Gomez, Andres. / Thickness-dependent differential reflectance spectra of monolayer and few-layer MoS₂, MoSe₂, WS₂ and WSe₂ In: Nanomaterials. 2018 ; Vol. 8, No. 9.

@article{b62479eb92db46fd8aa74846ba57ac6a,

title = "Thickness-dependent differential reflectance spectra of monolayer and few-layer MoS2, MoSe2, WS2 and WSe2 ",

abstract = "The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nanomaterials. We presented a comprehensive study of the differential reflectance spectra of 2D semiconducting transition metal dichalcogenides (TMDCs), MoS2, MoSe2, WS2, and WSe2, with thickness ranging from one layer up to six layers. We analyzed the thickness-dependent energy of the different excitonic features, indicating the change in the band structure of the different TMDC materials with the number of layers. Our work provided a route to employ differential reflectance spectroscopy for determining the number of layers of MoS2, MoSe2, WS2, and WSe2.",

keywords = "2D materials, Differential reflectance, MoS, MoSe, Optical properties, Transition metal dichalcogenides (TMDCs), WS, WSe",

author = "Yue Niu and Sergio Gonzalez-Abad and Riccardo Frisenda and Philipp Marauhn and Matthias Dr{\"u}ppel and Patricia Gant and Robert Schmidt and Taghavi, {Najme S.} and David Barcons and Molina-Mendoza, {Aday J.} and {de Vasconcellos}, {Steffen Michaelis} and Rudolf Bratschitsch and {De Lara}, {David Perez} and Michael Rohlfing and Andres Castellanos-Gomez",

year = "2018",

month = sep,

day = "14",

doi = "10.3390/nano8090725",

language = "英语",

volume = "8",

journal = "Nanomaterials",

issn = "2079-4991",

publisher = "MDPI Multidisciplinary Digital Publishing Institute",

number = "9",

}

Niu, Y, Gonzalez-Abad, S, Frisenda, R, Marauhn, P, Drüppel, M, Gant, P, Schmidt, R, Taghavi, NS, Barcons, D, Molina-Mendoza, AJ, de Vasconcellos, SM, Bratschitsch, R, De Lara, DP, Rohlfing, M & Castellanos-Gomez, A 2018, 'Thickness-dependent differential reflectance spectra of monolayer and few-layer MoS₂, MoSe₂, WS₂ and WSe₂ ', Nanomaterials, vol. 8, no. 9, 725. https://doi.org/10.3390/nano8090725

Thickness-dependent differential reflectance spectra of monolayer and few-layer MoS₂, MoSe₂, WS₂ and WSe₂ . / Niu, Yue; Gonzalez-Abad, Sergio; Frisenda, Riccardo; Marauhn, Philipp; Drüppel, Matthias; Gant, Patricia; Schmidt, Robert; Taghavi, Najme S.; Barcons, David; Molina-Mendoza, Aday J.; de Vasconcellos, Steffen Michaelis; Bratschitsch, Rudolf; De Lara, David Perez; Rohlfing, Michael; Castellanos-Gomez, Andres.

In: Nanomaterials, Vol. 8, No. 9, 725, 14.09.2018.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Thickness-dependent differential reflectance spectra of monolayer and few-layer MoS2, MoSe2, WS2 and WSe2

AU - Niu, Yue

AU - Gonzalez-Abad, Sergio

AU - Frisenda, Riccardo

AU - Marauhn, Philipp

AU - Drüppel, Matthias

AU - Gant, Patricia

AU - Schmidt, Robert

AU - Taghavi, Najme S.

AU - Barcons, David

AU - Molina-Mendoza, Aday J.

AU - de Vasconcellos, Steffen Michaelis

AU - Bratschitsch, Rudolf

AU - De Lara, David Perez

AU - Rohlfing, Michael

AU - Castellanos-Gomez, Andres

PY - 2018/9/14

Y1 - 2018/9/14

N2 - The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nanomaterials. We presented a comprehensive study of the differential reflectance spectra of 2D semiconducting transition metal dichalcogenides (TMDCs), MoS2, MoSe2, WS2, and WSe2, with thickness ranging from one layer up to six layers. We analyzed the thickness-dependent energy of the different excitonic features, indicating the change in the band structure of the different TMDC materials with the number of layers. Our work provided a route to employ differential reflectance spectroscopy for determining the number of layers of MoS2, MoSe2, WS2, and WSe2.

AB - The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nanomaterials. We presented a comprehensive study of the differential reflectance spectra of 2D semiconducting transition metal dichalcogenides (TMDCs), MoS2, MoSe2, WS2, and WSe2, with thickness ranging from one layer up to six layers. We analyzed the thickness-dependent energy of the different excitonic features, indicating the change in the band structure of the different TMDC materials with the number of layers. Our work provided a route to employ differential reflectance spectroscopy for determining the number of layers of MoS2, MoSe2, WS2, and WSe2.

KW - 2D materials

KW - Differential reflectance

KW - MoS

KW - MoSe

KW - Optical properties

KW - Transition metal dichalcogenides (TMDCs)

KW - WS

KW - WSe

UR - http://www.scopus.com/inward/record.url?scp=85054267953&partnerID=8YFLogxK

U2 - 10.3390/nano8090725

DO - 10.3390/nano8090725

M3 - 文章

AN - SCOPUS:85054267953

VL - 8

JO - Nanomaterials

JF - Nanomaterials

SN - 2079-4991

IS - 9

M1 - 725

ER -