Thickness-dependent differential reflectance spectra of monolayer and few-layer MoS2, MoSe2, WS2 and WSe2

Yue Niu, Sergio Gonzalez-Abad, Riccardo Frisenda, Philipp Marauhn, Matthias Drüppel, Patricia Gant, Robert Schmidt, Najme S. Taghavi, David Barcons, Aday J. Molina-Mendoza, Steffen Michaelis de Vasconcellos, Rudolf Bratschitsch, David Perez De Lara, Michael Rohlfing, Andres Castellanos-Gomez*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

53 Scopus citations

Abstract

The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nanomaterials. We presented a comprehensive study of the differential reflectance spectra of 2D semiconducting transition metal dichalcogenides (TMDCs), MoS2, MoSe2, WS2, and WSe2, with thickness ranging from one layer up to six layers. We analyzed the thickness-dependent energy of the different excitonic features, indicating the change in the band structure of the different TMDC materials with the number of layers. Our work provided a route to employ differential reflectance spectroscopy for determining the number of layers of MoS2, MoSe2, WS2, and WSe2.

Original languageEnglish
Article number725
JournalNanomaterials
Volume8
Issue number9
DOIs
StatePublished - 14 Sep 2018
Externally publishedYes

Keywords

  • 2D materials
  • Differential reflectance
  • MoS
  • MoSe
  • Optical properties
  • Transition metal dichalcogenides (TMDCs)
  • WS
  • WSe

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