The non-resonant magnetic x-ray scattering cross section of MnF2. 2. High-energy x-ray diffraction at 80 keV

J. Strempfer, T. Brückel*, U. Rütt, J. R. Schneider, K. D. Liss, T. Tschentscher

*Corresponding author for this work

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33 Scopus citations

Abstract

Results of high-energy non-resonant magnetic X-ray diffraction experiments performed on the model system MnF2 at a photon energy of 80 keV are presented. A surprisingly high peak intensity of the magnetic 300 reflection of 13 000 photons s-1 in the three-crystal mode and 19 000 Photonss-1 in the two-crystal mode, with a peak-to-background ratio of 230:1 and 10:1, respectively, has been achieved. At 80 keV, the penetration depth is 7mm. When the path length of the beam through the crystal is varied, the effect of volume enhancement of the intensity diffracted by magnetic reflections is demonstrated. The Q dependence of the magnetic and the charge Bragg reflections has been measured and agrees well with theory. The measurement of the temperature dependence of the sublattice magnetization allows a very accurate determination of the critical exponent β = 0.333 (3) and the Néel temperature TN = 67.713 (2) K. Finally, the multiple charge scattering is discussed, which is very pronounced for the magnetic reflections of MnF2.

Original languageEnglish
Pages (from-to)438-449
Number of pages12
JournalActa Crystallographica Section A: Foundations of Crystallography
Volume52
Issue number3
DOIs
StatePublished - 1 May 1996
Externally publishedYes

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