Structural characterization of epitaxial Fe/Cr multilayers using anomalous X-ray and neutron reflectivity

A. Gupta, A. Paul, M. Gupta, C. Meneghini, U. Pietsch, K. Mibu, A. Maddalena, S. Dal Toé, G. Principi*

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

6 Scopus citations

Abstract

The interface structure of epitaxial Fe/Cr multilayers was studied using anomalous X-ray and neutron reflectivity. The analysis of X-ray reflectivity at three different energies provided a reliable information about the interface roughnesses. It is found that the Cr-on-Fe interface is more diffused as compared to the Fe-on-Cr interface and that the roughness exhibits a significant increase with increasing depth. The magnetic roughness, as determined from neutron reflectivity, is lower than the geometrical roughness, in conformity with the behavior of a number of magnetic thin films and multilayers.

Original languageEnglish
Pages (from-to)1219-1220
Number of pages2
JournalJournal of Magnetism and Magnetic Materials
Volume272-276
DOIs
StatePublished - May 2004
Externally publishedYes
EventProceedings of the International Conference on Magnetism - Rome, Italy
Duration: 27 Jul 20031 Aug 2003

Keywords

  • GMR
  • Interface roughness
  • Magnetic multilayer
  • Magnetic roughness
  • Reflectivity

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