We report on the enhanced capabilities of neutron reflectometer V6 at the research reactor BER II at Helmholtz-Zentrum Berlin fr Materialien und Energie (HZB) in investigating magnetic thin films and multilayers. It is now fully equipped for simultaneous measurements of specular and off-specular scattering with polarization and polarization analysis. The magnetization configuration of a [CoO/Co/Au]×16 polycrystalline multilayer at room temperature is reported in demonstrating the efficiency of the instrument. The data is simulated within the supermatrix formalism under the distorted wave Born approximation for a quantitative analysis.
- Magnetic properties of interfaces
- Polarized neutron reflectometry