Specular and off-specular scattering with polarization and polarization analysis on reflectometer V6 at BER II, HZB

Amitesh Paul*, Thomas Krist, Anke Teichert, Roland Steitz

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

We report on the enhanced capabilities of neutron reflectometer V6 at the research reactor BER II at Helmholtz-Zentrum Berlin fr Materialien und Energie (HZB) in investigating magnetic thin films and multilayers. It is now fully equipped for simultaneous measurements of specular and off-specular scattering with polarization and polarization analysis. The magnetization configuration of a [CoO/Co/Au]×16 polycrystalline multilayer at room temperature is reported in demonstrating the efficiency of the instrument. The data is simulated within the supermatrix formalism under the distorted wave Born approximation for a quantitative analysis.

Original languageEnglish
Pages (from-to)1598-1606
Number of pages9
JournalPhysica B: Condensed Matter
Volume406
Issue number8
DOIs
StatePublished - 1 Apr 2011
Externally publishedYes

Keywords

  • Magnetic properties of interfaces
  • Polarized neutron reflectometry

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