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Short-circuiting in fullerene devices studied by in situ electrical measurement in high vacuum and infrared imaging analysis
H. R. Wu, M. L. Wang, Q. L. Song, Y. Wu, Z. T. Xie, X. D. Gao, X. M. Ding, X. Y. Hou*
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review