Progress in fabrication of high quality tantalum film absorber for STJ radiation detector

M. P. Lissitski*, D. Perez De Lara, R. Cristiano, M. L. Della Rocca, L. Maritato, M. Salvato

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

We report the fabrication and characterization of high quality tantalum films as absorbers for STJ radiation detectors. Values of the residual resistance ratio up to 75 and bulk value of the superconducting transition temperature Tc=4.5±0.1K have been achieved. Devices for detection with lateral aluminum superconducting tunnel junctions have been fabricated on such films. The detector response to X-ray is discussed.

Original languageEnglish
Pages (from-to)243-245
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume520
Issue number1-3
DOIs
StatePublished - 11 Mar 2004
Externally publishedYes

Keywords

  • Epitaxial thin film growing
  • Residual resistance ratio
  • Superconducting tunnel junction detector

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