Polarized neutron reflectivity of dilute magnetic semiconductors

Amitesh Paul*, Heiko Braak, Daniel E. Bürgler, Reinert Schreiber, Diana Rata, Peter Grünberg, Claus M. Schneider, Thomas Brückel

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

We report on a polarized neutron reflectivity investigation of the magnetization in Ge-based dilute magnetic semiconductors. We could observe a net magnetization from the splitting of the non-spin flip reflectivity patterns, which measure the magnetic moment parallel and antiparallel to the applied field. This contrast is visible at 50 K, at remanence and it is pronounced at higher fields even at 250 K for an inhomogeneous specimen. For a homogeneous sample the magnetic variation is visible only at 50 K and above 1.0 kOe. Thus, polarized neutron reflectivity can be a useful tool for investigating the magnetism in homogeneous and inhomogeneous thin film magnetic semiconductors.

Original languageEnglish
Pages (from-to)59-61
Number of pages3
JournalPhysica B: Condensed Matter
Volume397
Issue number1-2
DOIs
StatePublished - 15 Jul 2007
Externally publishedYes

Keywords

  • Magnetic semiconductors
  • Polarized neutron reflectometry

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