Model for evolution of periodic layered structure in the SiO2/Mg system

I. Gutman*, L. Klinger, I. Gotman, M. Shapiro

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Amathematicalmodel for the growth of MgO/Mg2Si periodic layered structure (PLS) is presented based on Fick's diffusion law and conservation of matter. The model explains the temporal evolution of the width of periodic layers at different temperatures, for layers distant enough from the Mg source. It is demonstrated that the difference in thickness of a pair of any two adjacent layers decreases with increasing temperature.

Original languageEnglish
Pages (from-to)1350-1355
Number of pages6
JournalSolid State Ionics
Volume180
Issue number26-27
DOIs
StatePublished - 19 Oct 2009
Externally publishedYes

Keywords

  • Binary oxides
  • Diffusion
  • Layered structures
  • Magnesium
  • Periodic patterns

Fingerprint Dive into the research topics of 'Model for evolution of periodic layered structure in the SiO2/Mg system'. Together they form a unique fingerprint.

Cite this