Microstructure Characterization of Cu2ZnSnS4 Thin Films Fabricated by Sulfurization at Different Temperatures

Xinqi Zhao*, Liangliang Fan, Junfeng Han, Wenquan Ming, Xiubo Yang, Shiyong Li, Yue Hong, Limei Cha

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Cu2ZnSnS4(CZTS)thin films were deposited on Mo-coated soda lime glass substrates by magnetron sputtering and sulfurization treatment. The microstructure of thin films sulfurized at different temperatures was studied using different microstructural charaterizations such as X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy(TEM), high angle annular dark field(HAADF) imaging and X-ray energy dispersive spectrum(EDS) analysis. The results showed that crystallization of CZTS films synthesized at above 400℃ was enhanced with the increase of annealing temperature from 400~550℃, but decomposition reaction of CZTS films occurred at 600℃. Films morphology was influenced by the temperatures greatly, the size of grains close to the surface of the thin films was large and the size of grains close to the Mo substrate was small. The CuS phase was observed on the surface of the thin films based on the rich of Cu and S, while the contents of Zn and Sn were rich close to the Mo substrate at relatively low temperatures. With the increase of temperatures, crystallization of CZTS films was enhanced with Cu, Zn, Sn and S gradual diffusion, and the grains of CZTS grew up as equiaxial crystals. Twins were formed in grains of CZTS.

Translated title of the contributionMicrostructure Characterization of Cu2ZnSnS4 Thin Films Fabricated by Sulfurization at Different Temperatures
Original languageChinese
Pages (from-to)85-89
Number of pages5
JournalHunan Daxue Xuebao/Journal of Hunan University Natural Sciences
Volume46
Issue number12
DOIs
StatePublished - 25 Dec 2019

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