Micro-reflectance and transmittance spectroscopy: A versatile and powerful tool to characterize 2D materials

Riccardo Frisenda, Yue Niu, Patricia Gant, Aday J. Molina-Mendoza, Robert Schmidt, Rudolf Bratschitsch, Jinxin Liu, Lei Fu, Dumitru Dumcenco, Andras Kis, David Perez De Lara, Andres Castellanos-Gomez

Research output: Contribution to journalArticlepeer-review

57 Scopus citations

Abstract

Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques for studying 2D materials. However, a thorough description of the experimental setups needed to carry out these measurements is lacking in the literature. We describe a versatile optical microscope setup for carrying out differential reflectance and transmittance spectroscopy in 2D materials with a lateral resolution of ∼1 μm in the visible and near-infrared part of the spectrum. We demonstrate the potential of the presented setup to determine the number of layers of 2D materials and characterize their fundamental optical properties, such as excitonic resonances. We illustrate its performance by studying mechanically exfoliated and chemical vapor-deposited transition metal dichalcogenide samples.

Original languageEnglish
Article number074002
JournalJournal Physics D: Applied Physics
Volume50
Issue number7
DOIs
StatePublished - 23 Jan 2017
Externally publishedYes

Keywords

  • 2D materials
  • differential reflectance
  • optical spectroscopy
  • transition metal dichalcogenides
  • transmittance

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