Micro-reflectance and transmittance spectroscopy: A versatile and powerful tool to characterize 2D materials

Riccardo Frisenda; Yue Niu; Patricia Gant; Aday J. Molina-Mendoza; Robert Schmidt; Rudolf Bratschitsch; Jinxin Liu; Lei Fu; Dumitru Dumcenco; Andras Kis; David Perez De Lara; Andres Castellanos-Gomez

doi:10.1088/1361-6463/aa5256

Micro-reflectance and transmittance spectroscopy: A versatile and powerful tool to characterize 2D materials

Riccardo Frisenda, Yue Niu, Patricia Gant, Aday J. Molina-Mendoza, Robert Schmidt, Rudolf Bratschitsch, Jinxin Liu, Lei Fu, Dumitru Dumcenco, Andras Kis, David Perez De Lara, Andres Castellanos-Gomez

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75 Scopus citations

Abstract

Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques for studying 2D materials. However, a thorough description of the experimental setups needed to carry out these measurements is lacking in the literature. We describe a versatile optical microscope setup for carrying out differential reflectance and transmittance spectroscopy in 2D materials with a lateral resolution of ∼1 μm in the visible and near-infrared part of the spectrum. We demonstrate the potential of the presented setup to determine the number of layers of 2D materials and characterize their fundamental optical properties, such as excitonic resonances. We illustrate its performance by studying mechanically exfoliated and chemical vapor-deposited transition metal dichalcogenide samples.

Original language	English
Article number	074002
Journal	Journal Physics D: Applied Physics
Volume	50
Issue number	7
DOIs	https://doi.org/10.1088/1361-6463/aa5256
State	Published - 23 Jan 2017
Externally published	Yes

Keywords

2D materials
differential reflectance
optical spectroscopy
transition metal dichalcogenides
transmittance

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10.1088/1361-6463/aa5256

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Frisenda, R., Niu, Y., Gant, P., Molina-Mendoza, A. J., Schmidt, R., Bratschitsch, R., Liu, J., Fu, L., Dumcenco, D., Kis, A., De Lara, D. P., & Castellanos-Gomez, A. (2017). Micro-reflectance and transmittance spectroscopy: A versatile and powerful tool to characterize 2D materials. Journal Physics D: Applied Physics, 50(7), [074002]. https://doi.org/10.1088/1361-6463/aa5256

Frisenda, Riccardo ; Niu, Yue ; Gant, Patricia ; Molina-Mendoza, Aday J. ; Schmidt, Robert ; Bratschitsch, Rudolf ; Liu, Jinxin ; Fu, Lei ; Dumcenco, Dumitru ; Kis, Andras ; De Lara, David Perez ; Castellanos-Gomez, Andres. / Micro-reflectance and transmittance spectroscopy : A versatile and powerful tool to characterize 2D materials. In: Journal Physics D: Applied Physics. 2017 ; Vol. 50, No. 7.

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abstract = "Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques for studying 2D materials. However, a thorough description of the experimental setups needed to carry out these measurements is lacking in the literature. We describe a versatile optical microscope setup for carrying out differential reflectance and transmittance spectroscopy in 2D materials with a lateral resolution of ∼1 μm in the visible and near-infrared part of the spectrum. We demonstrate the potential of the presented setup to determine the number of layers of 2D materials and characterize their fundamental optical properties, such as excitonic resonances. We illustrate its performance by studying mechanically exfoliated and chemical vapor-deposited transition metal dichalcogenide samples.",

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Micro-reflectance and transmittance spectroscopy : A versatile and powerful tool to characterize 2D materials. / Frisenda, Riccardo; Niu, Yue; Gant, Patricia; Molina-Mendoza, Aday J.; Schmidt, Robert; Bratschitsch, Rudolf; Liu, Jinxin; Fu, Lei; Dumcenco, Dumitru; Kis, Andras; De Lara, David Perez; Castellanos-Gomez, Andres.

In: Journal Physics D: Applied Physics, Vol. 50, No. 7, 074002, 23.01.2017.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Micro-reflectance and transmittance spectroscopy

T2 - A versatile and powerful tool to characterize 2D materials

AU - Frisenda, Riccardo

AU - Niu, Yue

AU - Gant, Patricia

AU - Molina-Mendoza, Aday J.

AU - Schmidt, Robert

AU - Bratschitsch, Rudolf

AU - Liu, Jinxin

AU - Fu, Lei

AU - Dumcenco, Dumitru

AU - Kis, Andras

AU - De Lara, David Perez

AU - Castellanos-Gomez, Andres

PY - 2017/1/23

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N2 - Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques for studying 2D materials. However, a thorough description of the experimental setups needed to carry out these measurements is lacking in the literature. We describe a versatile optical microscope setup for carrying out differential reflectance and transmittance spectroscopy in 2D materials with a lateral resolution of ∼1 μm in the visible and near-infrared part of the spectrum. We demonstrate the potential of the presented setup to determine the number of layers of 2D materials and characterize their fundamental optical properties, such as excitonic resonances. We illustrate its performance by studying mechanically exfoliated and chemical vapor-deposited transition metal dichalcogenide samples.

AB - Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques for studying 2D materials. However, a thorough description of the experimental setups needed to carry out these measurements is lacking in the literature. We describe a versatile optical microscope setup for carrying out differential reflectance and transmittance spectroscopy in 2D materials with a lateral resolution of ∼1 μm in the visible and near-infrared part of the spectrum. We demonstrate the potential of the presented setup to determine the number of layers of 2D materials and characterize their fundamental optical properties, such as excitonic resonances. We illustrate its performance by studying mechanically exfoliated and chemical vapor-deposited transition metal dichalcogenide samples.

KW - 2D materials

KW - differential reflectance

KW - optical spectroscopy

KW - transition metal dichalcogenides

KW - transmittance

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SN - 0022-3727

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Micro-reflectance and transmittance spectroscopy: A versatile and powerful tool to characterize 2D materials

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