TY - JOUR
T1 - Micro-reflectance and transmittance spectroscopy
T2 - A versatile and powerful tool to characterize 2D materials
AU - Frisenda, Riccardo
AU - Niu, Yue
AU - Gant, Patricia
AU - Molina-Mendoza, Aday J.
AU - Schmidt, Robert
AU - Bratschitsch, Rudolf
AU - Liu, Jinxin
AU - Fu, Lei
AU - Dumcenco, Dumitru
AU - Kis, Andras
AU - De Lara, David Perez
AU - Castellanos-Gomez, Andres
N1 - Publisher Copyright:
© 2017 IOP Publishing Ltd.
Copyright:
Copyright 2018 Elsevier B.V., All rights reserved.
PY - 2017/1/23
Y1 - 2017/1/23
N2 - Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques for studying 2D materials. However, a thorough description of the experimental setups needed to carry out these measurements is lacking in the literature. We describe a versatile optical microscope setup for carrying out differential reflectance and transmittance spectroscopy in 2D materials with a lateral resolution of ∼1 μm in the visible and near-infrared part of the spectrum. We demonstrate the potential of the presented setup to determine the number of layers of 2D materials and characterize their fundamental optical properties, such as excitonic resonances. We illustrate its performance by studying mechanically exfoliated and chemical vapor-deposited transition metal dichalcogenide samples.
AB - Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques for studying 2D materials. However, a thorough description of the experimental setups needed to carry out these measurements is lacking in the literature. We describe a versatile optical microscope setup for carrying out differential reflectance and transmittance spectroscopy in 2D materials with a lateral resolution of ∼1 μm in the visible and near-infrared part of the spectrum. We demonstrate the potential of the presented setup to determine the number of layers of 2D materials and characterize their fundamental optical properties, such as excitonic resonances. We illustrate its performance by studying mechanically exfoliated and chemical vapor-deposited transition metal dichalcogenide samples.
KW - 2D materials
KW - differential reflectance
KW - optical spectroscopy
KW - transition metal dichalcogenides
KW - transmittance
UR - http://www.scopus.com/inward/record.url?scp=85011272728&partnerID=8YFLogxK
U2 - 10.1088/1361-6463/aa5256
DO - 10.1088/1361-6463/aa5256
M3 - 文章
AN - SCOPUS:85011272728
VL - 50
JO - Journal Physics D: Applied Physics
JF - Journal Physics D: Applied Physics
SN - 0022-3727
IS - 7
M1 - 074002
ER -