Lattice positions of Sn in Cu2ZnSnS4 nanoparticles and thin films studied by synchrotron X-ray absorption near edge structure analysis

E. Zillner, A. Paul, J. Jutimoosik, S. Chandarak, T. Monnor, S. Rujirawat, R. Yimnirun, X. Z. Lin, A. Ennaoui, Th Dittrich, M. Lux-Steiner

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Abstract

Lattice positions of Sn in kesterite Cu2ZnSnS4 and Cu2SnS3 nanoparticles and thin films were investigated by XANES (x-ray absorption near edge structure) analysis at the S K-edge. XANES spectra were analyzed by comparison with simulations taking into account anti-site defects and vacancies. Annealing of Cu2ZnSnS4 nanoparticle thin films led to a decrease of Sn at its native and defect sites. The results show that XANES analysis at the S K-edge is a sensitive tool for the investigation of defect sites, being critical in kesterite thin film solar cells.

Original languageEnglish
Article number221908
JournalApplied Physics Letters
Volume102
Issue number22
DOIs
StatePublished - 3 Jun 2013

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