Internal stress measurements by high-energy synchrotron X-ray diffraction at increased specimen-detector distance

J. Böhm, A. Wanner*, R. Kampmann, H. Franz, K. D. Liss, A. Schreyer, H. Clemens

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

High-energy X-ray diffraction has recently been shown to be a viable technique to measure volume-averaged lattice strains in the bulk of metallic polycrystals at increased speed compared to neutron diffraction. The established procedure is to irradiate the sample under investigation with monochromatic X-rays (∼100 keV) and to record complete diffraction rings with an area detector. The lattice strains are obtained by analyzing the minute distortions of these rings. In the present paper we present first results obtained using a setup in which two area detectors are positioned at a large distance (7 m) from the specimen. Although only segments of the rings can be recorded this way, this approach offers a number of advantages. In situ tensile tests were performed on a γ-TiAl-based alloy as an example to demonstrate the potential of the method. Both materials science aspects as well as consequences for further method development will be discussed.

Original languageEnglish
Pages (from-to)315-322
Number of pages8
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume200
DOIs
StatePublished - Jan 2003
Externally publishedYes

Keywords

  • Grain size
  • Internal stress measurement
  • Monochromatic high-energy X-rays
  • Synchrotron X-ray diffraction
  • Transmission

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