Electron beam evaporation of oriented Nb films onto GaAs crystals in ultrahigh vacuum

M. Eizenberg*, D. A. Smith, M. Heiblum, Armin Segmüller

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Thin layers of Nb, 100-400 Å thick, were grown by electron beam evaporation on (100)GaAs substrates in a molecular beam epitaxy system. The crystallographic relationship between deposit and substrate was monitored in situ by reflection high-energy electron diffraction, and after deposition by transmission electron microscopy and grazing-incidence x-ray diffraction. In spite of the large lattice mismatch (17%) and the low deposition temperature (40-400°C), a quite well oriented deposit with the orientation (100)Nb∥(100)GaAs and [001]Nb∥[011]GaAs was obtained for a substrate temperature of ∼170°C. Changing the substrate temperature from the optimum value of ∼170°C in either direction resulted in a gradual deterioration of the epitaxy.

Original languageEnglish
Pages (from-to)422-424
Number of pages3
JournalApplied Physics Letters
Volume49
Issue number7
DOIs
StatePublished - 1986
Externally publishedYes

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