Effect of interface structure correlation on magnetoresistance of Fe/Cr multilayers

Amitesh Paul*, Ajay Gupta, S. M. Chaudhari, D. M. Phase

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

29 Scopus citations

Abstract

Effect of interfacial roughness on giant magnetoresistance (GMR) in Fe/Cr multilayers has been studied. A set of samples is prepared by simultaneously depositing on a set of float-glass (FG) substrates with varying rms surface roughness. This causes the correlated part of the rms roughness to vary from sample to sample. Another set of specimen is irradiated with 200 MeV Ag ions in order to induce uncorrelated roughness at the interfaces. In both the cases morphological and other microstructural features of different multilayers remained similar, thus allowing one to separate the effect of interface roughness from that of morphological changes. GMR measurements on these multilayers show that increasing interfacial roughness causes GMR to decrease nonlinearly. It is found that the effect of uncorrelated part of the roughness is much stronger than that of the correlated part.

Original languageEnglish
Pages (from-to)401-405
Number of pages5
JournalVacuum
Volume60
Issue number4
DOIs
StatePublished - Mar 2001
Externally publishedYes

Keywords

  • Giant magnetoresistance
  • Interface structure and roughness
  • Magnetic films and multilayers

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