Effect of forming gas annealing on the degradation properties of Ge-based MOS stacks

F. Aguirre, S. Pazos, F. R.M. Palumbo, S. Fadida, R. Winter, M. Eizenberg

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Fingerprint Dive into the research topics of 'Effect of forming gas annealing on the degradation properties of Ge-based MOS stacks'. Together they form a unique fingerprint.

Physics & Astronomy