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Direct observation of both contact and remote oxygen scavenging of GeO2 in a metal-oxide-semiconductor stack
S. Fadida*, P. Shekhter, D. Cvetko, L. Floreano, A. Verdini, L. Nyns, S. Van Elshocht, I. Kymissis, M. Eizenberg
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
8
Scopus
citations