Determination of the dielectric constant of InGaAs based gate stacks by a modified thickness series method

Igor Krylov*, Moshe Eizenberg, Dan Ritter

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Fingerprint Dive into the research topics of 'Determination of the dielectric constant of InGaAs based gate stacks by a modified thickness series method'. Together they form a unique fingerprint.

Physics & Astronomy