Defect depth profiling of CdZnTe using high-energy diffraction measurements

M. S. Goorsky*, H. Yoon, M. Ohler, K. Liss

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations

Fingerprint

Dive into the research topics of 'Defect depth profiling of CdZnTe using high-energy diffraction measurements'. Together they form a unique fingerprint.

Mathematics

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds