Defect depth profiling of CdZnTe using high-energy diffraction measurements

M. S. Goorsky*, H. Yoon, M. Ohler, K. Liss

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations

Abstract

We utilized monochromatic high energy synchrotron x-rays (100 keV) to perform transmission diffraction measurements on bulk cadmium zinc telluride (Cd1-xZnxTe, x to approximately 0.1) crystals used for room temperature radiation detectors. The high-energy measurements assess the crystalline properties throughout the thickness (2-3 mm) of the structures and we determined - in combination with standard high-resolution diffraction measurements - that most defects propagate through the width of the sample. Maps of both composition and crystalline quality were generated using both the high energy and standard diffraction sources and a clear correlation was observed for both composition variation and for mosaic structure. In some cases, up to twenty individual peaks are observed in a rocking curve with a beam size of 100×100 μm2 which allows for a determination of the crystallite size. This experiment represents the first time in which transmission high-energy x-ray diffraction techniques have been applied to examine the crystal quality of Cd1-xZnxTe used in nuclear radiation detector applications. The technique allows one to measure the bulk structural properties of thick (mm's) crystals and the technique is particularly useful because these crystals are used as bulk devices. Hence, this enables one to perform a proper analysis of the relationship between the structural defects (present in the bulk) and the detector performance.

Original languageEnglish
Pages (from-to)108-114
Number of pages7
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3768
DOIs
StatePublished - 1999
Externally publishedYes
EventProceedings of the 1999 Hard X-Ray, Gamma-Ray, and Neutron Detector Physics - Denver, CO, USA
Duration: 19 Jul 199923 Jul 1999

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