TY - JOUR
T1 - Correlations between electrical properties and interfacial reactions for cobalt-germanium contacts to n-type GaAs
AU - Genut, M.
AU - Eizenberg, M.
N1 - Copyright:
Copyright 2007 Elsevier B.V., All rights reserved.
PY - 1988
Y1 - 1988
N2 - Correlations between the electrical properties and interfacial reactions for the Co/GaAs, Co/Ge/GaAs, and Ge/Co/GaAs contact systems have been studied. Current-voltage and capacitance-voltage measurements show that for all three systems following heat treatments at temperatures not higher than 400°C, a rectifying contact was obtained. However, annealing in the temperature range of 450-600°C leads to an ohmic behavior; the lowest contact resistivity value (2.7×10-4 Ω cm2) was obtained for Co/Ge/GaAs following heat treatment at 500°C. The electrical properties of the contacts are correlated with modifications in the structure and composition of the metallization interfacing the GaAs as determined by Auger electron spectroscopy, transmission electron microscopy, and x-ray diffraction.
AB - Correlations between the electrical properties and interfacial reactions for the Co/GaAs, Co/Ge/GaAs, and Ge/Co/GaAs contact systems have been studied. Current-voltage and capacitance-voltage measurements show that for all three systems following heat treatments at temperatures not higher than 400°C, a rectifying contact was obtained. However, annealing in the temperature range of 450-600°C leads to an ohmic behavior; the lowest contact resistivity value (2.7×10-4 Ω cm2) was obtained for Co/Ge/GaAs following heat treatment at 500°C. The electrical properties of the contacts are correlated with modifications in the structure and composition of the metallization interfacing the GaAs as determined by Auger electron spectroscopy, transmission electron microscopy, and x-ray diffraction.
UR - http://www.scopus.com/inward/record.url?scp=33749149729&partnerID=8YFLogxK
U2 - 10.1063/1.99846
DO - 10.1063/1.99846
M3 - 文章
AN - SCOPUS:33749149729
VL - 53
SP - 672
EP - 674
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 8
ER -