Comparison of neutron and high energy synchrotron radiation as tools for texture and stress analysis

A. Pyzalla*, W. Reimers, K. D. Liss

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

6 Scopus citations

Abstract

Residual stress analysis was analyzed using high-energy synchrotron diffraction. Texture and stress analyses were also carried out using the energy dispersive methods, and parameters such as penetration depth, peak brightness were also determined. Coarse grain materials were analyzed and large spectral ranges along with high energy values were obtained.

Original languageEnglish
Pages (from-to)34-39
Number of pages6
JournalMaterials Science Forum
Volume347
StatePublished - 2000
Externally publishedYes
EventProceedings of the 5th European Conference on Residual Stresses - Delft-Noordwijkerhout, Neth
Duration: 28 Sep 199930 Sep 1999

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