Residual stress analysis was analyzed using high-energy synchrotron diffraction. Texture and stress analyses were also carried out using the energy dispersive methods, and parameters such as penetration depth, peak brightness were also determined. Coarse grain materials were analyzed and large spectral ranges along with high energy values were obtained.
|Number of pages||6|
|Journal||Materials Science Forum|
|State||Published - 2000|
|Event||Proceedings of the 5th European Conference on Residual Stresses - Delft-Noordwijkerhout, Neth|
Duration: 28 Sep 1999 → 30 Sep 1999