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Comparative study of radiation defect dynamics in 3C-SiC by X-ray diffraction, Raman scattering, and ion channeling
L. B. Bayu Aji*, E. Stavrou, J. B. Wallace, A. Boulle, A. Debelle, S. O. Kucheyev
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
6
Scopus
citations