Biaxial strain in atomically thin transition metal dichalcogenides

Riccardo Frisenda, Robert Schmidt, Steffen Michaelis De Vasconcellos, Rudolf Bratschitsch, David Perez De Lara, Andres Castellanos-Gomez

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Strain engineering in single-layer semiconducting transition metal dichalcogenides aims to tune their bandgap energy and to modify their optoelectronic properties by the application of external strain. In this paper we study transition metal dichalcogenides monolayers deposited on polymeric substrates under the application of biaxial strain, both tensile and compressive. We can control the amount of biaxial strain applied by letting the substrate thermally expand or compress by changing the substrate temperature. After modelling the substrate-dependent strain transfer process with a finite elements simulation, we performed micro-differential spectroscopy of four transition metal dichalcogenides monolayers (MoS2, MoSe2, WS2, WSe2) under the application of biaxial strain and measured their optical properties. For tensile strain we observe a redshift of the bandgap that reaches a value as large as 94 meV/% in the case of single-layer WS2 deposited on polypropylene. The observed bandgap shifts as a function of substrate extension/ compression follow the order WS2 < WSe2 < MoS2 < MoSe2.

Original languageEnglish
Title of host publicationOptical Sensing, Imaging, and Photon Counting
Subtitle of host publicationNanostructured Devices and Applications 2017
EditorsManijeh Razeghi, Oleg Mitrofanov, Jose Luis Pau Vizcaino, Chee Hing Tan
PublisherSPIE
ISBN (Electronic)9781510611634
DOIs
StatePublished - 2017
Externally publishedYes
EventOptical Sensing, Imaging, and Photon Counting: Nanostructured Devices and Applications 2017 - San Diego, United States
Duration: 9 Aug 201710 Aug 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10353
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Sensing, Imaging, and Photon Counting: Nanostructured Devices and Applications 2017
CountryUnited States
CitySan Diego
Period9/08/1710/08/17

Keywords

  • differential reflectance
  • monolayer
  • optical properties
  • strain engineering
  • transition metal dichalcogenides

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