A neutron diffraction study on the very narrow dynamical width of GaAs [200]

K. D. Liss*, A. Magerl, W. Gläser

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

The energy resolution associated with a particular Bragg reflection is limited by the diffraction properties and by the quality of the material. It can be derived from the structure factor within the dynamic theory of diffraction for ideal crystals. Using the GaAs [200] reflection on a neutron backscattering spectrometer we could realize a resolution of ΔE = (43 ± 5) neV. This is an improvement by about a factor of 3 as compared to the value calculated for ideal Si [111] and by about a factor of 7 as compared to the best experimental energy resolution available of any crystal spectrometer.

Original languageEnglish
Pages (from-to)523-527
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume335
Issue number3
DOIs
StatePublished - 1 Nov 1993
Externally publishedYes

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