Fingerprint
Dive into the research topics of 'A comparative study of AlN and Al2O3 based gate stacks grown by atomic layer deposition on InGaAs'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
A comparative study of AlN and Al2O3 based gate stacks grown by atomic layer deposition on InGaAs
Igor Krylov*, Boaz Pokroy, Dan Ritter, Moshe Eizenberg
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
11
Scopus
citations