不同硫化温度下铜锌锡硫薄膜的微观组织结构表征

Translated title of the contribution: Microstructure Characterization of Cu2ZnSnS4 Thin Films Fabricated by Sulfurization at Different Temperatures

Xinqi Zhao*, Liangliang Fan, Junfeng Han, Wenquan Ming, Xiubo Yang, Shiyong Li, Yue Hong, Limei Cha

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Fingerprint

Dive into the research topics of 'Microstructure Characterization of Cu2ZnSnS4 Thin Films Fabricated by Sulfurization at Different Temperatures'. Together they form a unique fingerprint.

Physics & Astronomy