Abstract
We show that introducing a mercaptan-terminated organophosphonate nanomolecular layer (NML) at the Al-SiO2 interface decreases the effective metal work function Φeff by 0.67 eV. In contrast, introducing a methyl-terminated organophosphonate NML has a negligible impact on Φeff. Photoelectron spectroscopy of NML-tailored surfaces and Al-NML-SiO2 interfaces indicate that Al bonds with oxidized mercaptan moieties form Al-O-S bridges, which determine the Φeff shift. Our findings should be useful for molecularly tailoring the electronic properties of metal-ceramic interfaces for electronics and energy device applications.
Original language | English |
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Article number | 121602 |
Journal | Applied Physics Letters |
Volume | 111 |
Issue number | 12 |
DOIs | |
State | Published - 18 Sep 2017 |
Externally published | Yes |